Techniques and algorithms for fault grading of FPGA interconnect test configurations. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/tcad/TahooriM04>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Mehdi_Baradaran_Tahoori>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2003.822112>
foaf:homepage	<https://doi.org/10.1109/TCAD.2003.822112>
dc:identifier	DBLP journals/tcad/TahooriM04 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FTCAD.2003.822112 (xsd:string)
dcterms:issued	2004 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label	Techniques and algorithms for fault grading of FPGA interconnect test configurations. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Mehdi_Baradaran_Tahoori>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
swrc:number	2 (xsd:string)
swrc:pages	261-272 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/tcad/TahooriM04/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/tcad/TahooriM04>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/tcad/tcad23.html#TahooriM04>
rdfs:seeAlso	<https://doi.org/10.1109/TCAD.2003.822112>
dc:title	Techniques and algorithms for fault grading of FPGA interconnect test configurations. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	23 (xsd:string)