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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/TakahashiBST02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwame_Osei_Boateng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.986429>
foaf:homepage <https://doi.org/10.1109/43.986429>
dc:identifier DBLP journals/tcad/TakahashiBST02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.986429 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwame_Osei_Boateng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
swrc:number 3 (xsd:string)
swrc:pages 362-368 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/TakahashiBST02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/TakahashiBST02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad21.html#TakahashiBST02>
rdfs:seeAlso <https://doi.org/10.1109/43.986429>
dc:title On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 21 (xsd:string)