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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/WangC06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seongmoon_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2005.855929>
foaf:homepage <https://doi.org/10.1109/TCAD.2005.855929>
dc:identifier DBLP journals/tcad/WangC06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2005.855929 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seongmoon_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
swrc:number 8 (xsd:string)
swrc:pages 1555-1564 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/WangC06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/WangC06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#WangC06>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2005.855929>
dc:title A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 25 (xsd:string)