A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcad/WangC06
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A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs.
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A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs.
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