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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/WangHCKL18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chien-Chung_Ho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ping-Hsien_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tei-Wei_Kuo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-Chen_Wang_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuan-Hao_Chang_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2018.2857260>
foaf:homepage <https://doi.org/10.1109/TCAD.2018.2857260>
dc:identifier DBLP journals/tcad/WangHCKL18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2018.2857260 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Scrubbing-Aware Secure Deletion for 3-D NAND Flash. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chien-Chung_Ho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ping-Hsien_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tei-Wei_Kuo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-Chen_Wang_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuan-Hao_Chang_0001>
swrc:number 11 (xsd:string)
swrc:pages 2790-2801 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/WangHCKL18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/WangHCKL18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad37.html#WangHCKL18>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2018.2857260>
dc:title Scrubbing-Aware Secure Deletion for 3-D NAND Flash. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)