Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcad/WangMTCCYY21
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tcad/WangMTCCYY21
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chase_Cook
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jianlei_Yang_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Liang_Chen_0025
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shaobin_Ma
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sheldon_X.-D._Tan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wenjian_Yu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xiaoyi_Wang
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2020.3001264
>
foaf:
homepage
<
https://doi.org/10.1109/TCAD.2020.3001264
>
dc:
identifier
DBLP journals/tcad/WangMTCCYY21
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTCAD.2020.3001264
(xsd:string)
dcterms:
issued
2021
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tcad
>
rdfs:
label
Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chase_Cook
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jianlei_Yang_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Liang_Chen_0025
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shaobin_Ma
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sheldon_X.-D._Tan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wenjian_Yu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xiaoyi_Wang
>
swrc:
number
3
(xsd:string)
swrc:
pages
507-520
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tcad/WangMTCCYY21/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tcad/WangMTCCYY21
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tcad/tcad40.html#WangMTCCYY21
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TCAD.2020.3001264
>
dc:
title
Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
40
(xsd:string)