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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/XieCF00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dingming_Xie>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leonard_Forbes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mengzhang_Cheng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.892853>
foaf:homepage <https://doi.org/10.1109/43.892853>
dc:identifier DBLP journals/tcad/XieCF00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.892853 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label SPICE models for flicker noise in n-MOSFETs from subthreshold tostrong inversion. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dingming_Xie>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Leonard_Forbes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mengzhang_Cheng>
swrc:number 11 (xsd:string)
swrc:pages 1293-1303 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/XieCF00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/XieCF00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad19.html#XieCF00>
rdfs:seeAlso <https://doi.org/10.1109/43.892853>
dc:title SPICE models for flicker noise in n-MOSFETs from subthreshold tostrong inversion. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 19 (xsd:string)