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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/YuJEB97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Barrie_W._Jervis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ian_M._Bell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kevin_R._Eckersall>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Yu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.644623>
foaf:homepage <https://doi.org/10.1109/43.644623>
dc:identifier DBLP journals/tcad/YuJEB97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.644623 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Barrie_W._Jervis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ian_M._Bell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kevin_R._Eckersall>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Yu>
swrc:number 8 (xsd:string)
swrc:pages 930-935 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/YuJEB97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/YuJEB97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#YuJEB97>
rdfs:seeAlso <https://doi.org/10.1109/43.644623>
dc:title Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)