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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/ZhangWLCLWLW19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Albert_Z._Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chenkun_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daguang_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fei_Lu_0004>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feilong_Zhang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qi_Chen_0008>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/X._Shawn_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2018.2818707>
foaf:homepage <https://doi.org/10.1109/TCAD.2018.2818707>
dc:identifier DBLP journals/tcad/ZhangWLCLWLW19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2018.2818707 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label A Full-Chip ESD Protection Circuit Simulation and Fast Dynamic Checking Method Using SPICE and ESD Behavior Models. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Albert_Z._Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chenkun_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daguang_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fei_Lu_0004>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feilong_Zhang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qi_Chen_0008>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/X._Shawn_Wang>
swrc:number 3 (xsd:string)
swrc:pages 489-498 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/ZhangWLCLWLW19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/ZhangWLCLWLW19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad38.html#ZhangWLCLWLW19>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2018.2818707>
dc:title A Full-Chip ESD Protection Circuit Simulation and Fast Dynamic Checking Method Using SPICE and ESD Behavior Models. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 38 (xsd:string)