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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/ZhangYWC17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bonan_Yan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaobin_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yaojun_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yiran_Chen_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2016.2619484>
foaf:homepage <https://doi.org/10.1109/TCAD.2016.2619484>
dc:identifier DBLP journals/tcad/ZhangYWC17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2016.2619484 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Persistent and Nonpersistent Error Optimization for STT-RAM Cell Design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bonan_Yan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaobin_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yaojun_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yiran_Chen_0001>
swrc:number 7 (xsd:string)
swrc:pages 1181-1192 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/ZhangYWC17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/ZhangYWC17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad36.html#ZhangYWC17>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2016.2619484>
dc:title Persistent and Nonpersistent Error Optimization for STT-RAM Cell Design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 36 (xsd:string)