An All-Digital On-Chip Peak-to-Peak Jitter Measurement Circuit With Automatic Resolution Calibration for High PVT-Variation Resilience.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcas/ChouW19
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tcas/ChouW19
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jinn-Shyan_Wang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Pei-Yuan_Chou
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTCSI.2019.2899902
>
foaf:
homepage
<
https://doi.org/10.1109/TCSI.2019.2899902
>
dc:
identifier
DBLP journals/tcas/ChouW19
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTCSI.2019.2899902
(xsd:string)
dcterms:
issued
2019
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tcas
>
rdfs:
label
An All-Digital On-Chip Peak-to-Peak Jitter Measurement Circuit With Automatic Resolution Calibration for High PVT-Variation Resilience.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jinn-Shyan_Wang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Pei-Yuan_Chou
>
swrc:
number
7
(xsd:string)
swrc:
pages
2508-2518
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tcas/ChouW19/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tcas/ChouW19
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tcas/tcasI66.html#ChouW19
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TCSI.2019.2899902
>
dc:
title
An All-Digital On-Chip Peak-to-Peak Jitter Measurement Circuit With Automatic Resolution Calibration for High PVT-Variation Resilience.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
66-I
(xsd:string)