Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcas/FinocchiaroGMPR18
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Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas.
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Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas.
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