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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcas/FinocchiaroGMPR18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alberto_Pagani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Finocchiaro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Motta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Egidio_Ragonese>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Girlando>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Palmisano>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCSII.2018.2852949>
foaf:homepage <https://doi.org/10.1109/TCSII.2018.2852949>
dc:identifier DBLP journals/tcas/FinocchiaroGMPR18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCSII.2018.2852949 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcas>
rdfs:label Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alberto_Pagani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Finocchiaro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Motta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Egidio_Ragonese>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Girlando>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Palmisano>
swrc:number 10 (xsd:string)
swrc:pages 1355-1359 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcas/FinocchiaroGMPR18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcas/FinocchiaroGMPR18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcas/tcasII65.html#FinocchiaroGMPR18>
rdfs:seeAlso <https://doi.org/10.1109/TCSII.2018.2852949>
dc:title Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 65-II (xsd:string)