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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcas/PuZIMKTNSS11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Kawasumi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Muramatsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hirofumi_Shinohara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katsuyuki_Ikeuchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Takamiya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Nomura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takayasu_Sakurai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xin_Zhang_0025>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Pu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCSII.2011.2149050>
foaf:homepage <https://doi.org/10.1109/TCSII.2011.2149050>
dc:identifier DBLP journals/tcas/PuZIMKTNSS11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCSII.2011.2149050 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcas>
rdfs:label Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Kawasumi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Muramatsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hirofumi_Shinohara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katsuyuki_Ikeuchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Takamiya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Nomura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takayasu_Sakurai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xin_Zhang_0025>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Pu>
swrc:number 5 (xsd:string)
swrc:pages 294-298 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcas/PuZIMKTNSS11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcas/PuZIMKTNSS11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcas/tcasII58.html#PuZIMKTNSS11>
rdfs:seeAlso <https://doi.org/10.1109/TCSII.2011.2149050>
dc:title Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 58-II (xsd:string)