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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcas/ShanSWCZY19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chuan_Zhang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Cai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Yang_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weiwei_Shan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xinchao_Shang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xing_Wan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCSI.2019.2893294>
foaf:homepage <https://doi.org/10.1109/TCSI.2019.2893294>
dc:identifier DBLP journals/tcas/ShanSWCZY19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCSI.2019.2893294 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcas>
rdfs:label A Wide-Voltage-Range Half-Path Timing Error-Detection System With a 9-Transistor Transition-Detector in 40-nm CMOS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chuan_Zhang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Cai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Yang_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weiwei_Shan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xinchao_Shang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xing_Wan>
swrc:number 6 (xsd:string)
swrc:pages 2288-2297 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcas/ShanSWCZY19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcas/ShanSWCZY19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcas/tcasI66.html#ShanSWCZY19>
rdfs:seeAlso <https://doi.org/10.1109/TCSI.2019.2893294>
dc:title A Wide-Voltage-Range Half-Path Timing Error-Detection System With a 9-Transistor Transition-Detector in 40-nm CMOS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 66-I (xsd:string)