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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcas/ShangFY12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Yu_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Fei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yang_Shang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCSI.2011.2180441>
foaf:homepage <https://doi.org/10.1109/TCSI.2011.2180441>
dc:identifier DBLP journals/tcas/ShangFY12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCSI.2011.2180441 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcas>
rdfs:label Analysis and Modeling of Internal State Variables for Dynamic Effects of Nonvolatile Memory Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Yu_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Fei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yang_Shang>
swrc:number 9 (xsd:string)
swrc:pages 1906-1918 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcas/ShangFY12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcas/ShangFY12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcas/tcasI59.html#ShangFY12>
rdfs:seeAlso <https://doi.org/10.1109/TCSI.2011.2180441>
dc:title Analysis and Modeling of Internal State Variables for Dynamic Effects of Nonvolatile Memory Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 59-I (xsd:string)