A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End Local Field Potential Acquisition Unit With ¬Ī3.6-V Stimulation Artifact Tolerance and Monopolar Electrode-Tissue Impedance Measurement Circuit for Closed-Loop Deep Brain Stimulation SoCs.
A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End Local Field Potential Acquisition Unit With ¬Ī3.6-V Stimulation Artifact Tolerance and Monopolar Electrode-Tissue Impedance Measurement Circuit for Closed-Loop Deep Brain Stimulation SoCs.
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A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End Local Field Potential Acquisition Unit With ¬Ī3.6-V Stimulation Artifact Tolerance and Monopolar Electrode-Tissue Impedance Measurement Circuit for Closed-Loop Deep Brain Stimulation SoCs.
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