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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcasI/KumarCTCA23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hussam_Amrouch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shubham_Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Simon_Thomann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Swetaki_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yogesh_Singh_Chauhan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCSI.2023.3265427>
foaf:homepage <https://doi.org/10.1109/TCSI.2023.3265427>
dc:identifier DBLP journals/tcasI/KumarCTCA23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCSI.2023.3265427 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcasI>
rdfs:label Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hussam_Amrouch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shubham_Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Simon_Thomann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Swetaki_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yogesh_Singh_Chauhan>
swrc:month July (xsd:string)
swrc:number 7 (xsd:string)
swrc:pages 2891-2903 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcasI/KumarCTCA23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcasI/KumarCTCA23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcasI/tcasI70.html#KumarCTCA23>
rdfs:seeAlso <https://doi.org/10.1109/TCSI.2023.3265427>
dc:title Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 70 (xsd:string)