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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcasI/LinH22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao-Chiao_Hong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Long-Yi_Lin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCSI.2021.3087520>
foaf:homepage <https://doi.org/10.1109/TCSI.2021.3087520>
dc:identifier DBLP journals/tcasI/LinH22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCSI.2021.3087520 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcasI>
rdfs:label Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao-Chiao_Hong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Long-Yi_Lin>
swrc:number 1 (xsd:string)
swrc:pages 114-127 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcasI/LinH22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcasI/LinH22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcasI/tcasI69.html#LinH22>
rdfs:seeAlso <https://doi.org/10.1109/TCSI.2021.3087520>
dc:title Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 69 (xsd:string)