A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcasI/OveisiH22
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A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise.
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A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise.
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