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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcasII/ShenWLZW22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xing_Zhang_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yize_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuan_Wang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yunhao_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zilong_Shen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCSII.2021.3123838>
foaf:homepage <https://doi.org/10.1109/TCSII.2021.3123838>
dc:identifier DBLP journals/tcasII/ShenWLZW22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCSII.2021.3123838 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcasII>
rdfs:label A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xing_Zhang_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yize_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuan_Wang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yunhao_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zilong_Shen>
swrc:number 3 (xsd:string)
swrc:pages 1547-1551 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcasII/ShenWLZW22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcasII/ShenWLZW22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcasII/tcasII69.html#ShenWLZW22>
rdfs:seeAlso <https://doi.org/10.1109/TCSII.2021.3123838>
dc:title A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 69 (xsd:string)