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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tce/SuHYLLJABW24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gagangeet_Singh_Aujla>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jie_Su>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_Ye>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Reheem_Beyah>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shouling_Ji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sizhuang_Liang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tao_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhen_Hong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhenyu_Wen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCE.2023.3347651>
foaf:homepage <https://doi.org/10.1109/TCE.2023.3347651>
dc:identifier DBLP journals/tce/SuHYLLJABW24 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCE.2023.3347651 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tce>
rdfs:label Trustworthy IAP: An Intelligent Applications Profiler to Investigate Vulnerabilities of Consumer Electronic Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gagangeet_Singh_Aujla>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jie_Su>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_Ye>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Reheem_Beyah>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shouling_Ji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sizhuang_Liang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tao_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhen_Hong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhenyu_Wen>
swrc:month February (xsd:string)
swrc:number 1 (xsd:string)
swrc:pages 4605-4616 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tce/SuHYLLJABW24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tce/SuHYLLJABW24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tce/tce70.html#SuHYLLJABW24>
rdfs:seeAlso <https://doi.org/10.1109/TCE.2023.3347651>
dc:title Trustworthy IAP: An Intelligent Applications Profiler to Investigate Vulnerabilities of Consumer Electronic Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 70 (xsd:string)