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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tce/XuYY24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hejie_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naigong_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qiao_Xu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCE.2023.3262290>
foaf:homepage <https://doi.org/10.1109/TCE.2023.3262290>
dc:identifier DBLP journals/tce/XuYY24 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCE.2023.3262290 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tce>
rdfs:label Unsupervised Representation Learning for Large-Scale Wafer Maps in Micro-Electronic Manufacturing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hejie_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naigong_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qiao_Xu>
swrc:month February (xsd:string)
swrc:number 1 (xsd:string)
swrc:pages 1226-1235 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tce/XuYY24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tce/XuYY24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tce/tce70.html#XuYY24>
rdfs:seeAlso <https://doi.org/10.1109/TCE.2023.3262290>
dc:title Unsupervised Representation Learning for Large-Scale Wafer Maps in Micro-Electronic Manufacturing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 70 (xsd:string)