Exploring the Effect of Device Aging on Static Power Analysis Attacks.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tches/KarimiMM19
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Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tches/KarimiMM19
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Amir_Moradi_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Naghmeh_Karimi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Thorben_Moos
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.13154%2Ftches.v2019.i3.233-256
>
foaf:
homepage
<
https://doi.org/10.13154/tches.v2019.i3.233-256
>
dc:
identifier
DBLP journals/tches/KarimiMM19
(xsd:string)
dc:
identifier
DOI doi.org%2F10.13154%2Ftches.v2019.i3.233-256
(xsd:string)
dcterms:
issued
2019
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tches
>
rdfs:
label
Exploring the Effect of Device Aging on Static Power Analysis Attacks.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Amir_Moradi_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Naghmeh_Karimi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Thorben_Moos
>
swrc:
number
3
(xsd:string)
swrc:
pages
233-256
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tches/KarimiMM19/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tches/KarimiMM19
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tches/tches2019.html#KarimiMM19
>
rdfs:
seeAlso
<
https://doi.org/10.13154/tches.v2019.i3.233-256
>
dc:
title
Exploring the Effect of Device Aging on Static Power Analysis Attacks.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
2019
(xsd:string)