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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcs/Reischuk00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R%E2%88%9A%C4%BEdiger_Reischuk>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2FS0304-3975%2899%2900237-6>
foaf:homepage <https://doi.org/10.1016/S0304-3975(99)00237-6>
dc:identifier DBLP journals/tcs/Reischuk00 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2FS0304-3975%2899%2900237-6 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcs>
rdfs:label Can large fanin circuits perform reliable computations in the presence of faults? (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R%E2%88%9A%C4%BEdiger_Reischuk>
swrc:number 2 (xsd:string)
swrc:pages 319-335 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcs/Reischuk00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcs/Reischuk00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcs/tcs240.html#Reischuk00>
rdfs:seeAlso <https://doi.org/10.1016/S0304-3975(99)00237-6>
dc:title Can large fanin circuits perform reliable computations in the presence of faults? (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 240 (xsd:string)