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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/technometrics/LiuDY23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juan_Du_0009>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xingchen_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhisheng_Ye_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1080%2F00401706.2022.2156614>
foaf:homepage <https://doi.org/10.1080/00401706.2022.2156614>
dc:identifier DBLP journals/technometrics/LiuDY23 (xsd:string)
dc:identifier DOI doi.org%2F10.1080%2F00401706.2022.2156614 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/technometrics>
rdfs:label A Covariate-Regulated Sparse Subspace Learning Model and Its Application to Process Monitoring and Fault Isolation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juan_Du_0009>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xingchen_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhisheng_Ye_0001>
swrc:month April (xsd:string)
swrc:number 2 (xsd:string)
swrc:pages 269-280 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/technometrics/LiuDY23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/technometrics/LiuDY23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/technometrics/technometrics65.html#LiuDY23>
rdfs:seeAlso <https://doi.org/10.1080/00401706.2022.2156614>
dc:title A Covariate-Regulated Sparse Subspace Learning Model and Its Application to Process Monitoring and Fault Isolation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 65 (xsd:string)