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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tecs/SinghBLM13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anshul_Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arindam_Basu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keck_Voon_Ling>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincent_John_Mooney_III>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F2536747.2536761>
foaf:homepage <https://doi.org/10.1145/2536747.2536761>
dc:identifier DBLP journals/tecs/SinghBLM13 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F2536747.2536761 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tecs>
rdfs:label Models for characterizing noise based PCMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anshul_Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arindam_Basu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keck_Voon_Ling>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincent_John_Mooney_III>
swrc:number 1s (xsd:string)
swrc:pages 39:1-39:30 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tecs/SinghBLM13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tecs/SinghBLM13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tecs/tecs13.html#SinghBLM13>
rdfs:seeAlso <https://doi.org/10.1145/2536747.2536761>
dc:title Models for characterizing noise based PCMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 13 (xsd:string)