A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tetc/KatoWSKW20
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A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips.
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A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips.
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