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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tie/AvinoSalvadoBBRBRMP24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christophe_Raynaud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cyril_Buttay>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ferran_Bonet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Herv%E2%88%9A%C2%A9_Morel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Rebollo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Oriol_Avino-Salvado>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pascal_Bevilacqua>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xavier_Perpi%E2%88%9A%C4%AA%E2%88%9A%E2%80%A0>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIE.2023.3281705>
foaf:homepage <https://doi.org/10.1109/TIE.2023.3281705>
dc:identifier DBLP journals/tie/AvinoSalvadoBBRBRMP24 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIE.2023.3281705 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tie>
rdfs:label Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christophe_Raynaud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cyril_Buttay>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ferran_Bonet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Herv%E2%88%9A%C2%A9_Morel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Rebollo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Oriol_Avino-Salvado>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pascal_Bevilacqua>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xavier_Perpi%E2%88%9A%C4%AA%E2%88%9A%E2%80%A0>
swrc:month May (xsd:string)
swrc:number 5 (xsd:string)
swrc:pages 5285-5295 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tie/AvinoSalvadoBBRBRMP24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tie/AvinoSalvadoBBRBRMP24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tie/tie71.html#AvinoSalvadoBBRBRMP24>
rdfs:seeAlso <https://doi.org/10.1109/TIE.2023.3281705>
dc:title Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 71 (xsd:string)