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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tie/JahdiAARM15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Ran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olayiwola_Alatise>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Petros_Alexakis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philip_Mawby>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saeed_Jahdi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIE.2014.2326999>
foaf:homepage <https://doi.org/10.1109/TIE.2014.2326999>
dc:identifier DBLP journals/tie/JahdiAARM15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIE.2014.2326999 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tie>
rdfs:label The Impact of Temperature and Switching Rate on the Dynamic Characteristics of Silicon Carbide Schottky Barrier Diodes and MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Ran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olayiwola_Alatise>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Petros_Alexakis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philip_Mawby>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saeed_Jahdi>
swrc:number 1 (xsd:string)
swrc:pages 163-171 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tie/JahdiAARM15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tie/JahdiAARM15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tie/tie62.html#JahdiAARM15>
rdfs:seeAlso <https://doi.org/10.1109/TIE.2014.2326999>
dc:title The Impact of Temperature and Switching Rate on the Dynamic Characteristics of Silicon Carbide Schottky Barrier Diodes and MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 62 (xsd:string)