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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tie/RamalingamKS18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Esther_Florence_Sundarsingh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kanagasabai_Malathi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vimal_Samsingh_Ramalingam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIE.2017.2716876>
foaf:homepage <https://doi.org/10.1109/TIE.2017.2716876>
dc:identifier DBLP journals/tie/RamalingamKS18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIE.2017.2716876 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tie>
rdfs:label Transit Time Dependent Condition Monitoring of PCBs During Testing for Diagnostics in Electronics Industry. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Esther_Florence_Sundarsingh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kanagasabai_Malathi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vimal_Samsingh_Ramalingam>
swrc:number 1 (xsd:string)
swrc:pages 553-560 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tie/RamalingamKS18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tie/RamalingamKS18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tie/tie65.html#RamalingamKS18>
rdfs:seeAlso <https://doi.org/10.1109/TIE.2017.2716876>
dc:title Transit Time Dependent Condition Monitoring of PCBs During Testing for Diagnostics in Electronics Industry. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 65 (xsd:string)