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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tie/RonankiW20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Deepak_Ronanki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sheldon_S._Williamson>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIE.2019.2912771>
foaf:homepage <https://doi.org/10.1109/TIE.2019.2912771>
dc:identifier DBLP journals/tie/RonankiW20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIE.2019.2912771 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tie>
rdfs:label Failure Prediction of Submodule Capacitors in Modular Multilevel Converter by Monitoring the Intrinsic Capacitor Voltage Fluctuations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Deepak_Ronanki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sheldon_S._Williamson>
swrc:number 4 (xsd:string)
swrc:pages 2585-2594 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tie/RonankiW20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tie/RonankiW20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tie/tie67.html#RonankiW20>
rdfs:seeAlso <https://doi.org/10.1109/TIE.2019.2912771>
dc:title Failure Prediction of Submodule Capacitors in Modular Multilevel Converter by Monitoring the Intrinsic Capacitor Voltage Fluctuations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 67 (xsd:string)