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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tie/SunFQZ16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bo_Sun_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng_Qian_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guoqi_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xuejun_Fan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIE.2016.2581156>
foaf:homepage <https://doi.org/10.1109/TIE.2016.2581156>
dc:identifier DBLP journals/tie/SunFQZ16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIE.2016.2581156 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tie>
rdfs:label PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bo_Sun_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng_Qian_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guoqi_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xuejun_Fan>
swrc:number 11 (xsd:string)
swrc:pages 6726-6735 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tie/SunFQZ16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tie/SunFQZ16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tie/tie63.html#SunFQZ16>
rdfs:seeAlso <https://doi.org/10.1109/TIE.2016.2581156>
dc:title PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 63 (xsd:string)