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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tie/ZhangZ23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pinjia_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qinghao_Zhang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIE.2022.3212405>
foaf:homepage <https://doi.org/10.1109/TIE.2022.3212405>
dc:identifier DBLP journals/tie/ZhangZ23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIE.2022.3212405 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tie>
rdfs:label A Novel Model of the Aging Effect on the ON-State Resistance of SiC Power MOSFETs for High-Accuracy Package-Related Aging Evaluation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pinjia_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qinghao_Zhang>
swrc:month September (xsd:string)
swrc:number 9 (xsd:string)
swrc:pages 9495-9504 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tie/ZhangZ23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tie/ZhangZ23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tie/tie70.html#ZhangZ23>
rdfs:seeAlso <https://doi.org/10.1109/TIE.2022.3212405>
dc:title A Novel Model of the Aging Effect on the ON-State Resistance of SiC Power MOSFETs for High-Accuracy Package-Related Aging Evaluation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 70 (xsd:string)