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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tifs/MaPHZJ23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haocheng_Ma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiaji_He>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Max_Panoff>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yier_Jin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yiqiang_Zhao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIFS.2023.3239184>
foaf:homepage <https://doi.org/10.1109/TIFS.2023.3239184>
dc:identifier DBLP journals/tifs/MaPHZJ23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIFS.2023.3239184 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tifs>
rdfs:label EMSim: A Fast Layout Level Electromagnetic Emanation Simulation Framework for High Accuracy Pre-Silicon Verification. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haocheng_Ma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiaji_He>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Max_Panoff>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yier_Jin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yiqiang_Zhao>
swrc:pages 1365-1379 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tifs/MaPHZJ23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tifs/MaPHZJ23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tifs/tifs18.html#MaPHZJ23>
rdfs:seeAlso <https://doi.org/10.1109/TIFS.2023.3239184>
dc:title EMSim: A Fast Layout Level Electromagnetic Emanation Simulation Framework for High Accuracy Pre-Silicon Verification. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)