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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tii/AlviMRKK24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anis_Ur_Rahman_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Asad_Waqar_Malik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Muazzam_Ali_Khan_Khattak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Samee_U._Khan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Unaiza_Alvi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTII.2023.3262815>
foaf:homepage <https://doi.org/10.1109/TII.2023.3262815>
dc:identifier DBLP journals/tii/AlviMRKK24 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTII.2023.3262815 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tii>
rdfs:label Predicting Device Anomalous Condition in a Collaborated Industrial Environment. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anis_Ur_Rahman_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Asad_Waqar_Malik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Muazzam_Ali_Khan_Khattak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Samee_U._Khan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Unaiza_Alvi>
swrc:month January (xsd:string)
swrc:number 1 (xsd:string)
swrc:pages 390-398 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tii/AlviMRKK24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tii/AlviMRKK24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tii/tii20.html#AlviMRKK24>
rdfs:seeAlso <https://doi.org/10.1109/TII.2023.3262815>
dc:title Predicting Device Anomalous Condition in a Collaborated Industrial Environment. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)