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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tii/ChenZGZL24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Changhua_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feng_Guo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lin_Zuo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Liu_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhongshu_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTII.2023.3301065>
foaf:homepage <https://doi.org/10.1109/TII.2023.3301065>
dc:identifier DBLP journals/tii/ChenZGZL24 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTII.2023.3301065 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tii>
rdfs:label Weakly Supervised End-to-End Learning for Inspection on Multidirectional Integrated Circuit Markings in Surface Mount Technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Changhua_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feng_Guo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lin_Zuo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Liu_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhongshu_Chen>
swrc:month March (xsd:string)
swrc:number 3 (xsd:string)
swrc:pages 3133-3143 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tii/ChenZGZL24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tii/ChenZGZL24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tii/tii20.html#ChenZGZL24>
rdfs:seeAlso <https://doi.org/10.1109/TII.2023.3301065>
dc:title Weakly Supervised End-to-End Learning for Inspection on Multidirectional Integrated Circuit Markings in Surface Mount Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)