Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tii/KimHKL08
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tii/KimHKL08
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Lombardi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jing_Huang_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kyung_Ki_Kim
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yong-Bin_Kim
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTII.2008.924589
>
foaf:
homepage
<
https://doi.org/10.1109/TII.2008.924589
>
dc:
identifier
DBLP journals/tii/KimHKL08
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTII.2008.924589
(xsd:string)
dcterms:
issued
2008
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tii
>
rdfs:
label
Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Lombardi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jing_Huang_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kyung_Ki_Kim
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yong-Bin_Kim
>
swrc:
number
2
(xsd:string)
swrc:
pages
134-143
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tii/KimHKL08/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tii/KimHKL08
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tii/tii4.html#KimHKL08
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TII.2008.924589
>
dc:
title
Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
4
(xsd:string)