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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tii/LiJG21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pingyu_Jiang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pulin_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Guo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTII.2020.3014950>
foaf:homepage <https://doi.org/10.1109/TII.2020.3014950>
dc:identifier DBLP journals/tii/LiJG21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTII.2020.3014950 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tii>
rdfs:label Modeling of Machining Errors' Accumulation Driven by RFID Graphical Deduction Computing in Multistage Machining Processes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pingyu_Jiang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pulin_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Guo>
swrc:number 6 (xsd:string)
swrc:pages 3971-3981 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tii/LiJG21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tii/LiJG21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tii/tii17.html#LiJG21>
rdfs:seeAlso <https://doi.org/10.1109/TII.2020.3014950>
dc:title Modeling of Machining Errors' Accumulation Driven by RFID Graphical Deduction Computing in Multistage Machining Processes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 17 (xsd:string)