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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tim/CiofiCPS03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Calogero_Pace>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carmine_Ciofi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Felice_Crupi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Graziella_Scandurra>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIM.2003.817913>
foaf:homepage <https://doi.org/10.1109/TIM.2003.817913>
dc:identifier DBLP journals/tim/CiofiCPS03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIM.2003.817913 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tim>
rdfs:label Micro-prober for wafer-level low-noise measurements in MOS devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Calogero_Pace>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carmine_Ciofi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Felice_Crupi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Graziella_Scandurra>
swrc:number 5 (xsd:string)
swrc:pages 1533-1536 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tim/CiofiCPS03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tim/CiofiCPS03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tim/tim52.html#CiofiCPS03>
rdfs:seeAlso <https://doi.org/10.1109/TIM.2003.817913>
dc:title Micro-prober for wafer-level low-noise measurements in MOS devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 52 (xsd:string)