Guest Editorial Special Section on Built-In-Test. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Robert_W._Gao>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FTIM.2005.850322>
foaf:homepage	<https://doi.org/10.1109/TIM.2005.850322>
dc:identifier	DBLP journals/tim/Gao05 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FTIM.2005.850322 (xsd:string)
dcterms:issued	2005 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/tim>
rdfs:label	Guest Editorial Special Section on Built-In-Test. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Robert_W._Gao>
swrc:number	3 (xsd:string)
swrc:pages	939-940 (xsd:string)
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rdfs:seeAlso	<https://doi.org/10.1109/TIM.2005.850322>
dc:title	Guest Editorial Special Section on Built-In-Test. (xsd:string)
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rdf:type	swrc:Article
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swrc:volume	54 (xsd:string)