[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tim/Hou05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/An_Sang_Hou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIM.2005.847338>
foaf:homepage <https://doi.org/10.1109/TIM.2005.847338>
dc:identifier DBLP journals/tim/Hou05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIM.2005.847338 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tim>
rdfs:label A built-in-test scheme for evaluating the parameters of floating-gate MOS transistors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/An_Sang_Hou>
swrc:number 3 (xsd:string)
swrc:pages 988-995 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tim/Hou05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tim/Hou05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tim/tim54.html#Hou05>
rdfs:seeAlso <https://doi.org/10.1109/TIM.2005.847338>
dc:title A built-in-test scheme for evaluating the parameters of floating-gate MOS transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 54 (xsd:string)