A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques-Part II: dielectric property recalculation.
A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques-Part II: dielectric property recalculation.
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A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques-Part II: dielectric property recalculation.
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