From the Measurement of COSS-VDS Characteristic to the Estimation of the Channel Current in Medium Voltage SiC MOSFET Power Modules.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tim/RabkowskiZKGVL23
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tim/RabkowskiZKGVL23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fernando_Gonzalez-Hernando
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Irma_Villar
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jacek_Rabkowski
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mariusz_Zdanowski
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rafal_Kopacz
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Uxue_Larra%E2%88%9A%C4%AAaga
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTIM.2023.3291788
>
foaf:
homepage
<
https://doi.org/10.1109/TIM.2023.3291788
>
dc:
identifier
DBLP journals/tim/RabkowskiZKGVL23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTIM.2023.3291788
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tim
>
rdfs:
label
From the Measurement of COSS-VDS Characteristic to the Estimation of the Channel Current in Medium Voltage SiC MOSFET Power Modules.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fernando_Gonzalez-Hernando
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Irma_Villar
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jacek_Rabkowski
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mariusz_Zdanowski
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rafal_Kopacz
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Uxue_Larra%E2%88%9A%C4%AAaga
>
swrc:
pages
1-10
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tim/RabkowskiZKGVL23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tim/RabkowskiZKGVL23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tim/tim72.html#RabkowskiZKGVL23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TIM.2023.3291788
>
dc:
title
From the Measurement of COSS-VDS Characteristic to the Estimation of the Channel Current in Medium Voltage SiC MOSFET Power Modules.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
72
(xsd:string)