An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tim/RahamanDB08
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An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell.
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An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell.
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