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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tim/TaylorNCLCSHHB05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alan_Chong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bryan_Nelson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eddie_Chan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Henry_C._Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hosam_Haggag>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeff_Huard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jim_Braatz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karen_Taylor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mani_Soma>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIM.2005.847348>
foaf:homepage <https://doi.org/10.1109/TIM.2005.847348>
dc:identifier DBLP journals/tim/TaylorNCLCSHHB05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIM.2005.847348 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tim>
rdfs:label Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alan_Chong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bryan_Nelson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eddie_Chan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Henry_C._Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hosam_Haggag>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeff_Huard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jim_Braatz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karen_Taylor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mani_Soma>
swrc:number 3 (xsd:string)
swrc:pages 975-987 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tim/TaylorNCLCSHHB05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tim/TaylorNCLCSHHB05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tim/tim54.html#TaylorNCLCSHHB05>
rdfs:seeAlso <https://doi.org/10.1109/TIM.2005.847348>
dc:title Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 54 (xsd:string)