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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tim/YoonE05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jangsup_Yoon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_R._Eisenstadt>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIM.2005.855091>
foaf:homepage <https://doi.org/10.1109/TIM.2005.855091>
dc:identifier DBLP journals/tim/YoonE05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIM.2005.855091 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tim>
rdfs:label Embedded loopback test for RF ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jangsup_Yoon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_R._Eisenstadt>
swrc:number 5 (xsd:string)
swrc:pages 1715-1720 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tim/YoonE05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tim/YoonE05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tim/tim54.html#YoonE05>
rdfs:seeAlso <https://doi.org/10.1109/TIM.2005.855091>
dc:title Embedded loopback test for RF ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 54 (xsd:string)