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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tim/ZengWWYO21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaihong_Ou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liang_Wang_0039>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yue_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zheng_Zeng_0004>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTIM.2020.3024356>
foaf:homepage <https://doi.org/10.1109/TIM.2020.3024356>
dc:identifier DBLP journals/tim/ZengWWYO21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTIM.2020.3024356 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tim>
rdfs:label Inaccurate Switching Loss Measurement of SiC MOSFET Caused by Probes: Modelization, Characterization, and Validation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaihong_Ou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liang_Wang_0039>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yue_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zheng_Zeng_0004>
swrc:pages 1-14 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tim/ZengWWYO21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tim/ZengWWYO21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tim/tim70.html#ZengWWYO21>
rdfs:seeAlso <https://doi.org/10.1109/TIM.2020.3024356>
dc:title Inaccurate Switching Loss Measurement of SiC MOSFET Caused by Probes: Modelization, Characterization, and Validation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 70 (xsd:string)