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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tmc/ParkL12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jongho_Park_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tae-Jin_Lee_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTMC.2011.112>
foaf:homepage <https://doi.org/10.1109/TMC.2011.112>
dc:identifier DBLP journals/tmc/ParkL12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTMC.2011.112 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tmc>
rdfs:label Error Resilient Estimation and Adaptive Binary Selection for Fast and Reliable Identification of RFID Tags in Error-Prone Channel. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jongho_Park_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tae-Jin_Lee_0001>
swrc:number 6 (xsd:string)
swrc:pages 959-969 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tmc/ParkL12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tmc/ParkL12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tmc/tmc11.html#ParkL12>
rdfs:seeAlso <https://doi.org/10.1109/TMC.2011.112>
dc:title Error Resilient Estimation and Adaptive Binary Selection for Fast and Reliable Identification of RFID Tags in Error-Prone Channel. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 11 (xsd:string)