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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/todaes/Al-YamaniM05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmad_A._Al-Yamani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1109118.1109125>
foaf:homepage <https://doi.org/10.1145/1109118.1109125>
dc:identifier DBLP journals/todaes/Al-YamaniM05 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1109118.1109125 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label Test chip experimental results on high-level structural test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmad_A._Al-Yamani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
swrc:number 4 (xsd:string)
swrc:pages 690-701 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/todaes/Al-YamaniM05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/todaes/Al-YamaniM05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/todaes/todaes10.html#Al-YamaniM05>
rdfs:seeAlso <https://doi.org/10.1145/1109118.1109125>
dc:subject Structural test, VLSI test, complex gates, test experiment (xsd:string)
dc:title Test chip experimental results on high-level structural test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 10 (xsd:string)