Optimized wafer-probe and assembled package test design for analog circuits. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/todaes/BhattacharyaC05>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Soumendu_Bhattacharya>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1145%2F1059876.1059882>
foaf:homepage	<https://doi.org/10.1145/1059876.1059882>
dc:identifier	DBLP journals/todaes/BhattacharyaC05 (xsd:string)
dc:identifier	DOI doi.org%2F10.1145%2F1059876.1059882 (xsd:string)
dcterms:issued	2005 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label	Optimized wafer-probe and assembled package test design for analog circuits. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Soumendu_Bhattacharya>
swrc:number	2 (xsd:string)
swrc:pages	303-329 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/todaes/BhattacharyaC05/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/todaes/BhattacharyaC05>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/todaes/todaes10.html#BhattacharyaC05>
rdfs:seeAlso	<https://doi.org/10.1145/1059876.1059882>
dc:subject	Assembled package, analog and mixed-signal test, co-optimization, prototype, simulation, test, test cost minimization, test generation and co-optimization, wafer-probe (xsd:string)
dc:title	Optimized wafer-probe and assembled package test design for analog circuits. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	10 (xsd:string)