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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/todaes/BlantonH03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_P._Hayes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ronald_D._Blanton>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F606603.606609>
foaf:homepage <https://doi.org/10.1145/606603.606609>
dc:identifier DBLP journals/todaes/BlantonH03 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F606603.606609 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label On the properties of the input pattern fault model. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_P._Hayes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ronald_D._Blanton>
swrc:number 1 (xsd:string)
swrc:pages 108-124 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/todaes/BlantonH03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/todaes/BlantonH03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/todaes/todaes8.html#BlantonH03>
rdfs:seeAlso <https://doi.org/10.1145/606603.606609>
dc:subject ATPG, defects, fault models, fault testing, faults, testing digital circuits (xsd:string)
dc:title On the properties of the input pattern fault model. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 8 (xsd:string)